TitleProduct

Cell Tester

  • Price:

    Negotiable

  • minimum:

  • Total supply:

  • Delivery term:

    The date of payment from buyers deliver within days

  • seat:

    Hebei

  • Validity to:

    Long-term effective

  • Last update:

    2017-11-03 16:50

  • Browse the number:

    154

Send an inquiries
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QINHUANGDAO ZENITH SOLAR TECHNOLOGICAL CO., LTD.
Contactaixin:

Mr. Wang Chengwei(Mr.)  

Email:

telephone:

phone:

Arrea:

Hebei

Address:

Yazishan Industrial Park, Beigang Twon, Haigang District, Qinhuangdao, Hebei, China 066000

Website:

http://zenithsolar.aozbao.com/

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1. Model No. and description: SCT-A/B type Solar Cell Test apparatus
 
2 . Device main application: Tests and records Monocrystalline silicon, polycrystalline silicon solar cell performance parameters.
 
3. Specifications
 
3.1 Simulated light source
3.1.1 High-power pulsed 300W Germany Xenon lamp
3.1.2 Spectral range in line with IEC60904-9 spectral irradiance distribution demand AM1.5; Spectral mismatch error ±25% Grade A (please refer to test report issued by National Institute of Metrology
3.1.3 Light intensity 100mW/cm2 (adjustment range 70~120mW/cm2)
3.1.4 Pulse width 10mS
3.1.5 Light intensity non-uniformity: ±2% Grade A
3.1.6 Instability degree of irradiation: ± 0.5% Grade A (STI: ≤ ± 0.5%; LTI: ≤± 0.5%)
3.1.7 Xenon lamp life: 300,000 times (imported from Germany)
3.1.8 Flash frequency numeration function (replace zero reset)
3.1.9 Lighting deirection is vertical upwards lighting
3.2 Test range
3.2.1 Effective test area: 200mm×200mm
3.2.2 Effective test range: 0.1W~5W
3.2.3 Voltage measurement: 0V~0.8V(resolution 1mV)
3.2.4 Measuring current: 0m A~2A/20A(resolution 1mA)
3.2.5 Measuring temperature: 15ºC~35ºC(resolution 0.1ºC)
3.3 Test accuracy
3.3.1 Test repeatability: ±0.5%
3.3.2 Test error of Electrical performance: ≤2%
3.4 Measuring method: four-wire measurement
3.5 Test Parameters: Isc,Voc,Pmax,Vm,Im,FF,EFF,Temp ,Rs,Rsh,Rf
3.6 Test interval: 3 seconds/piece
3.7 Data acquisition: 14-bit high-speed synchronous acquisition card.
3.8 Test conditions calibration: Automatic correction devices (including manuallyenter the compensation parameters, automatic/manual temperature compensation,automatic compensation of light intensity)
3.9 Temperature measurement
3.9.1 Auto-test temperature
3.9.2 Temperature compensation and display
3.9.3 Correct temperature according to testing temperature.
3.10 Test result
3.10.1 display test time and the graphical parameters (I-V characteristic curve)
3.10.2 Test results have the ability to converted to the standard test conditions.
3.10.3 Test resuls with voice reports the number and voice prompts function.
3.11 Test report
3.11.1 Current working interface can display and record I-V characteristic curve.
3.11.2 All the cell's major test parameters can be saved to the specified file of hard disk.
3.11.3 The specified file can be named by yourself.
3.12 Data summarization and printing
3.12.1 Data can be summarized according to set time period or at any time.
3.12.2 Printing in Excel format. (including the of cumulative output of I-V characteristic curve)
3.13 Professional software
3.13.1 Temperature compensation coefficient input
3.13.2 Date Name Row-column numbers input
3.13.3 Serial numbers start setting auto-increment
3.13.4 Parameters range settings of Defective products
3.14 Working time: the device can continuous work for more than 12 hours.
3.15 Power supply: Single-phase 220V / 50Hz / 2kW
3.16 Equipment size: (long) 600mm×(width)800mm×(height)1900mm
3.17 Equipment Weight:125Kg
 
4. Complete machine configuration
4.1 Test host (including e-load): 1pc
4.2 light source: 1 set
4.3 Computer: 1pc (CPU Frequency memory 1G, hard disk drives 320G, LCD 19 inch)
4.4 14-bit synchronous high-speed A/D board: 1pc
4.5 Professional measurement software: 1 set
4.6 Printer (A4 inkjet color printers): 1PC
4.7 Standard Cell (used to adjust the light intensity and light intensity uniformity correction): 1pc